Characterization of mullite/ZrO2 toughness ceramic materials microstructure by medium voltage analytical electron microscopy

摘要

A series of mullite/ZrO2 and mullite/alumina/ZrO2 high-toughness ceramic materials have\udbeen examined by analytical electron microscopy (AEM) at 300 kV and by using the\udfollowing techniques: energy dispersive X-ray (EDX) microanalysis, microdiffraction and\udconvergent beam electron diffraction (CBED). The relative advantages and disadvantages\udfor the analysis at higher voltages on the investigation of advanced ceramics are compared\udwith results obtained at 120 kV.